Read JBL CS680 EMC - CB Certificate online
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Ref.No.:610604
IEC 60065
Clause
Requirement - Test
Result - Remark
Verdict
TRF No.: I60065__C
8.11
Detaching of wires
No undue reduction of creepage or clearance
distances if wires become detached
distances if wires become detached
No risk of any wire becoming
detached
detached
N/A
Vibration test carried out ........................................ : No, no need. See above
N/A
8.12
Adequate cross-sectional area of internal wiring to
mains socket-outlets
mains socket-outlets
N/A
8.13
Adequate fastening of windows, lenses, lamp
covers etc. (pull test 20 N for 10 s)
covers etc. (pull test 20 N for 10 s)
P
8.14
Adequate fastening of covers (pull test 50 N, for
10 s)
10 s)
P
8.15
No risk of damage to the insulation of internal
wiring due to hot parts or sharp edges
wiring due to hot parts or sharp edges
P
8.16
Only special supply equipment can be used
N/A
9
ELECTRIC SHOCK HAZARD UNDER NORMAL OPERATING CONDITIONS
9.1.1
Touch current measured from terminal devices
using the network in Annex D ................................ :
using the network in Annex D ................................ :
U1 = 0.08Vp (253V)
U2 = 0.09Vp (253V)
P
Discharge not exceeding 45
μC
N/A
Energy of discharge not exceeding 350 mJ
N/A
Test with test finger and test probe
P
9.1.2
No hazardous live shafts of knobs, handles or
levers
levers
P
9.1.3
Ventilation holes tested by means of
4 mm x 100 mm test pin
4 mm x 100 mm test pin
N/A
9.1.4
Terminal devices tested with 1 mm x 20 mm test
pin (10 N); test probe 16 of IEC 61032
pin (10 N); test probe 16 of IEC 61032
P
Terminal devices tested with 1 mm x 100 mm
straight wire (1N); test probe D of IEC 61032
straight wire (1N); test probe D of IEC 61032
P
9.1.5
Pre-set controls tested with 2.5 mm x 100 mm test
pin (10 N); test probe C of IEC 61032
pin (10 N); test probe C of IEC 61032
N/A
9.1.6
No shock hazard due to stored charge on
withdrawal of the mains plug; voltage (V) after 2 s :
withdrawal of the mains plug; voltage (V) after 2 s :
N/A
If C is not greater than 0.1
μF no test needed
P
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