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AUDIX Technology (Shenzhen) Co., Ltd.
Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E11588 page 12 of 336
2.4. Test Facility
Site Description
Name of Firm
:
Audix Technology (Shenzhen) Co., Ltd.
No. 6, Ke Feng Rd., 52 Block, Shenzhen
Science & Industrial Park, Nantou,
Shenzhen, Guangdong, China
No. 6, Ke Feng Rd., 52 Block, Shenzhen
Science & Industrial Park, Nantou,
Shenzhen, Guangdong, China
3m Anechoic Chamber
:
Certificated by FCC, USA
Registration Number: 90454
Valid Date: Mar.31, 2012
Registration Number: 90454
Valid Date: Mar.31, 2012
3m & 10m Anechoic Chamber
:
Certificated by FCC, USA
Registration Number: 794232
Valid Date: Dec.30, 2012
Registration Number: 794232
Valid Date: Dec.30, 2012
EMC Lab.
: Accredited by DAkkS, Germany
Registration No: D-PL-12151-01-01
Valid Date: Feb.01, 2014
Accredited by NVLAP, USA
NVLAP Code: 200372-0
Valid Date: Mar.31, 2012
Valid Date: Mar.31, 2012
2.5. Measurement Uncertainty（95% confidence levels, k=2）
Test Item
Uncertainty
Uncertainty for Conduction emission test
in No. 1 Conduction
3.2 dB
3.6 dB (30~200MHz, Polarize: H)
3.7 dB (30~200MHz, Polarize: V)
3.7 dB (30~200MHz, Polarize: V)
4.0 dB (200M~1GHz, Polarize: H)
Uncertainty for Radiation Emission test
in 3m chamber
3.7 dB (200M~1GHz, Polarize: V)
3.1dB (Distance: 3m Polarize: V)
Uncertainty for Radiation Emission test in
3m chamber (1GHz-18GHz)
3.7 dB (Distance: 3m Polarize: H)
Uncertainty for Flicker test
0.26%
Uncertainty for Harmonic test
1.8%
1.36dB (Using CDN test)
Uncertainty for C/S Test
3.20 (Using EM clamp test)
1.64 dB (80MHz~200MHz)
1.64 dB (80MHz~200MHz)
Uncertainty for R/S Test
1.66 dB(200MHz~1000MHz)
EN55020 S3
0.54 dB
0.6℃
Uncertainty for test site temperature and
humidity
3%
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