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AUDIX Technology (Shenzhen) Co., Ltd.
Audix Technology (Shenzhen) Co., Ltd. Report No. ACS-E12377 page 13 of 323
2.5. Measurement Uncertainty（95% confidence levels, k=2）
Test Item
Uncertainty
Uncertainty for Conduction emission test
in No. 1 Conduction
3.2 dB(150kHz to 30MHz)
3.6dB (30~200MHz, Polarize: H)
3.8dB (30~200MHz, Polarize: V)
3.8dB (30~200MHz, Polarize: V)
3.8dB (200M~1GHz, Polarize: H)
Uncertainty for Radiation Emission test
in 10m chamber (Distance: 10m)
3.8dB (200M~1GHz, Polarize: V)
3.6 dB (30~200MHz, Polarize: H)
3.6 dB (30~200MHz, Polarize: H)
3.8dB (30~200MHz, Polarize: V)
4.2dB (200M~1GHz, Polarize: H)
Uncertainty for Radiation Emission test
in 3m chamber
3.8dB (200M~1GHz, Polarize: V)
3.1dB (Distance: 3m Polarize: V)
Uncertainty for Radiation Emission test in
3m chamber (1GHz-18GHz)
3.7 dB (Distance: 3m Polarize: H)
2.4dB (Distance: 3m Polarize: V)
Uncertainty for SVSWR in 10m Chamber
2.4 dB (Distance: 3m Polarize: H)
Uncertainty for Flicker test
0.06%
Uncertainty for Harmonic test
1.8%
1.36dB (Using CDN test)
Uncertainty for C/S Test
3.20 (Using EM clamp test)
1.64 dB (80MHz~200MHz)
1.64 dB (80MHz~200MHz)
Uncertainty for R/S Test
1.66 dB(200MHz~1000MHz)
EN 55020 S3
0.54 dB
0.6℃
Uncertainty for test site temperature and
humidity
3%
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