Read JBL ON BEAT MINI (serv.man2) EMC - CB Certificate online
Page 1 of 99 Report No.: NTEK-2012DC1231016E
CE EMC Test Report
(Declaration of Conformity)
For
Electromagnetic Interference
Of
Product：
Speaker dock for iPhone, iPad and iPod
Trade Name：
JBL
Model Number：
JBL OnBeat Mini
Prepared for
Harman International Industries, Incorporated
Prepared by
Shenzhen NTEK Testing Technology Co., Ltd.
1/F, Building E, Fenda Science Park, Sanwei Community, Xixiang Street
Bao’an District, Shenzhen P.R. China
Tel.: +86-0755-61156588 Fax.: +86-0755-61156599
Website:www.ntek.org.cn
Page 2 of 99 Report No.: NTEK-2012DC1231016E
TEST RESULT CERTIFICATION
Applicant’s name
................. : Harman International Industries, Incorporated.
Manufacture's Name
............ : Harman International Industries, Incorporated.
Product description
Product name
........................... :
Speaker dock for iPhone, iPad and iPod
Model and/or type reference : JBL OnBeat Mini
Standards
............................. :
EN 55013:2001/A1:2003/A2:2006, EN 55020:2007/A11:2011,
EN 55022:2010, EN 55024:2010
EN 61000-3-2:2006/A1:2009/A2:2009
EN 61000-3-3:2008
EN 55022:2010, EN 55024:2010
EN 61000-3-2:2006/A1:2009/A2:2009
EN 61000-3-3:2008
This device described above has been tested by NTEK, and the test results show that the
equipment under test (EUT) is in compliance with the 2004/108/EC requirements. And it is
applicable only to the tested sample identified in the report.
This report shall not be reproduced except in full, without the written approval of NTEK, this
document may be altered or revised by NTEK, personal only, and shall be noted in the revision of
the document.
equipment under test (EUT) is in compliance with the 2004/108/EC requirements. And it is
applicable only to the tested sample identified in the report.
This report shall not be reproduced except in full, without the written approval of NTEK, this
document may be altered or revised by NTEK, personal only, and shall be noted in the revision of
the document.
Date of Test
............................................:
Date (s) of performance of tests .............: Dec. 31, 2012 ~Jan. 12, 2013
Date of Issue...........................................: Jan. 12, 2013
Test Result...............................................: Pass
Testing Engineer
:
(Jason Chen)
Technical Manager
:
(Jim He)
Authorized Signatory :
(Bovey Yang)
Page 3 of 99 Report No.: NTEK-2012DC1231016E
Table of Contents
Page
1 . TEST SUMMARY
7
1.1 TEST FACILITY
8
1.2 MEASUREMENT UNCERTAINTY
8
2 . GENERAL INFORMATION
9
2.1 GENERAL DESCRIPTION OF EUT
9
2.2 DESCRIPTION OF TEST MODES
10
2.3 DESCRIPTION OF TEST SETUP
11
2.4 DESCRIPTION TEST PERIPHERAL AND EUT PERIPHERAL
12
2.5 MEASUREMENT INSTRUMENTS LIST
13
3 . EMC EMISSION TEST
16
3.1 CONDUCTED EMISSION MEASUREMENT
16
3.1.1 POWER LINE CONDUCTED EMISSION
16
3.1.2 TEST PROCEDURE
17
3.1.3 TEST SETUP
17
3.1.4 EUT OPERATING CONDITIONS
17
3.1.5 TEST RESULTS
18
3.2 RADIATED EMISSION MEASUREMENT
22
3.2.6 TEST PROCEDURE
24
3.2.7 TEST SETUP
25
3.2.8 EUT OPERATING CONDITIONS
26
3.2.9 TEST RESULTS (30-1000MHz)
27
3.2.10 TEST RESULTS (30-300MHz)
35
3.2.11 TEST RESULTS(1000~6000MHz)
38
3.2.12 TEST RESULTS(Disturbance voltage at the antenna terminals)
39
3.3 HARMONICS CURRENT
40
3.3.1 LIMITS OF HARMONICS CURRENT
40
3.3.1.1 TEST PROCEDURE
41
3.3.1.2 EUT OPERATING CONDITIONS
41
3.3.1.3 TEST SETUP
41
3.3.2 TEST RESULTS
42
3.4 VOLTAGE FLUCTUATION AND FLICKERS
43
3.4.1 LIMITS OF VOLTAGE FLUCTUATION AND FLICKERS
43
3.4.1.1 TEST PROCEDURE
43
3.4.1.2 EUT OPERATING CONDITIONS
43
3.4.1.3 TEST SETUP
43
3.4.2 TEST RESULTS
44
